Objects
Ruppert, Michael G., Fairbairn, Matthew W., Moheimani, S. O. Reza. Institute of Electrical and Electronics Engineers (IEEE); 2013. Multi-mode resonant control of a microcantilever for atomic force microscopy.
Fairbairn, Matthew W., Moheimani, S. O. Reza. International Federation of Automatic Control (IFAC); 2013. A new approach to active Q control of an atomic force microscope micro-cantilever operating in tapping mode.
Fairbairn, Matthew W., Mueller, Philipp, Moheimani, S. O. Reza. Institute of Electrical and Electronics Engineers (IEEE); 2013. Active piezoelectric shunt control of an atomic force microscope micro-cantilever.
Fairbairn, Matthew W., Müller, Philipp, Moheimani, S. O. Reza. Institute of Electrical and Electronics Engineers (IEEE); 2014. Sensorless implementation of a PPF controller for active <i>Q</i> control of an AFM microcantilever.
Fairbairn, Matthew W., Moheimani, S.O. Reza. Institute of Electrical and Electronics Engineers (IEEE); 2012. Quality factor enhancement of an atomic force microscope micro-cantilever using piezoelectric shunt control.
Fairbairn, Matthew W., Moheimani, S. O. Reza. Engineers Australia; 2012. Minimizing probe loss in tapping mode atomic force microscopy using a switched gain resonant controller.
Fairbairn, Matthew W., Moheimani, S. O. Reza, Fleming, Andrew J.. Institute of Electrical and Electronics Engineers (IEEE); 2011. Passive piezoelectric shunt control of an Atomic Force Microscope microcantilever.
Fairbairn, Matthew W., Moheimani, S. O. Reza. Institute of Electrical and Electronics Engineers (IEEE); 2012. A switched gain resonant controller to minimize image artifacts in intermittent contact mode atomic force microscopy.
Fairbairn, Matthew W., Moheimani, S. O. Reza, Fleming, Andrew J.. Institute of Electrical and Electronics Engineers (IEEE); 2011. Improving the scan rate and image quality in tapping mode Atomic Force Microscopy with piezoelectric shunt control.
Fairbairn, Matthew W., Moheimani, S.O. Reza. Institute of Electrical and Electronics Engineers; 2013. Control techniques for increasing the scan speed and minimizing image artifacts in tapping-mode atomic force microscopy: toward video-rate nanoscale imaging.
Fairbairn, Matthew W., Wadikhaye, Sachin P., Moheimani, S. O. Reza. International Federation of Automatic Control (IFAC); 2014. Sensorless damping control of a high speed flexure guided nanopositioner.
Fairbairn, Matthew W., Moheimani, S. O. Reza, Fleming, Andrew J.. Institute of Electrical and Electronics Engineers (IEEE); 2011. Q control of an atomic force microscope microcantilever: a sensorless approach.